Insights into Cutting-Edge MRAM Technologies
We continuously track the evolution and industrial trends of MRAM technologies, share research achievements and practical experience of Jimiao Technology, and build a professional platform for technical exchanges.
Technical White Papers
MRAM Wafer-Level Testing Technology Roadmap [Download]
This paper systematically sorts out testing challenges and technical routes for STT/SOT/VCMA-MRAM, and puts forward suggestions on the evolution of testing capabilities for the 3nm process node. It covers:
• Methodologies for high-precision extraction of magnetoelectric characteristics
• Throughput optimization strategies for mass production testing
• New testing requirements for emerging compute-in-memory architectures
Development Report on Domestic MRAM Equipment Industry [Download]
Based on industrial chain research, this report analyzes the global competitive landscape of MRAM equipment, and discusses key bottlenecks and cooperation opportunities for domestic breakthroughs.
Application Notes
AN-001: How to Optimize Write Margin Test for STT-MRAM [Read]
This note elaborates on statistical methods and common pitfalls of Write Error Rate (WER) testing, and provides practical guidelines from single-bit to array-level testing.
AN-002: DC and Pulse Co-Characterization of SOT-MRAM Three-Terminal Devices [Read]
Aiming at the unique separated read-write paths of SOT-MRAM, this note introduces key techniques for accurate terminal resistance measurement and spin-orbit torque efficiency extraction.
AN-003: Reliability Considerations for MRAM in AI Inference Acceleration [Read]
This note discusses testing methods for endurance, read-write interference and temperature sensitivity of MRAM in compute-in-memory scenarios.
Video Tutorials
Jimiao Test Platform Operation Guide Series
• Ep.1: Wafer Loading and Automatic Alignment Process
• Ep.2: Test Program Configuration and Parameter Optimization
• Ep.3: Data Analysis and Report Generation
Technical Lecture Recordings
• "Beyond SRAM: Test Challenges and Solutions for Embedded MRAM" — Invited Report at Annual Semiconductor Equipment Conference
• "Magnetization Dynamics under Picosecond Pulses: The Role of Test Equipment" — Special Topic at Magnetics Conference
Industry Insights
Blog Articles
• [Opinion] Why MRAM Testing Cannot Simply Adopt Flash Test Equipment?
• [Observation] MRAM Technology Trends from ISSCC 2024: New Balance of Density, Speed and Power Consumption
• [Interpretation] Impact Analysis of New U.S. Export Control Rules on MRAM Equipment Supply Chain
Standards & Specifications
Standards Participated in Formulation by Jimiao Technology:
• Group Standard: Test Methods for Magnetoresistive Random Access Memory (MRAM) at Wafer Level (Under Development)
• Draft for Comments: Specification for Compute-In-Memory Chip Testing
Common Reference Standards:
• JEDEC JESD218: Solid-State Drive Requirements and Endurance Test Method
• AEC-Q100: Failure Mechanism Based Stress Test Qualification for Integrated Circuits
Events & Community
Upcoming Events
• 2024 MRAM Testing Technology Seminar (Shanghai, April) [Register]
• Webinar: New Testing Demands for Storage in the Compute-In-Memory Era [Reserve]
Technical Community
• GitHub Open Source Project: MRAM Test Data Analysis Toolkit [Visit]
• Q&A Forum: Direct Communication with Jimiao Engineers [Join]