Core Value Proposition
From R&D validation to mass production monitoring, we provide a testing infrastructure covering the entire lifecycle of MRAM, allowing the performance boundaries of magnetic memory to be accurately measured and ensuring that every storage unit can withstand future tests.
Core Product Line
12 inch fully automated high-throughput testing platform
The first domestically developed 12 inch MRAM wafer level high-speed testing system with independent intellectual property rights, achieving a leap from manual operation to unmanned operation. Integrating high-precision magnetic field control, picosecond pulse testing, and AI assisted data analysis, the daily wafer testing capability of a single device reaches the industry-leading level, providing core support for mass production ramp up.
Multi state magnetic storage characteristic characterization system
Provide configurable testing architectures for different technology routes such as STT-MRAM, SOT-MRAM, VCMA-MRAM, etc. Support the extraction of a complete set of magneto electric coupling characteristics such as toggle writing, thermal stability, read-write distortion, durability, etc., to assist in process iteration and device optimization.
Wafer level reliability acceleration assessment plan
The innovative accelerated testing algorithm based on the Arrhenius model compresses the traditional reliability verification that requires months to weeks. By combining high-sensitivity magnetic domain imaging with electrical failure analysis, potential failure modes can be identified in advance to reduce production risks.
Technical Advantage
Dimension | Industry Pain Points | Extreme Plan |
Test Efficiency | The testing time for a single die is long, and the bottleneck in production capacity is prominent | Parallel multi site architecture, throughput increased by 300%+ |
Magnetic Field Accuracy | Poor uniformity of external magnetic field and significant edge effect | Built in 3D Helmholtz coil, field uniformity<0.5% |
Data Value | Low utilization rate of massive test data | Real time yield prediction and process correlation analysis engine |
Equipment Dependency | 100% dependence on imported core equipment | Full stack autonomous and controllable, supply chain security |
Service Matrix
Customized testing and development
Jointly develop specialized testing algorithms and fixtures for customer specific device structures and application scenarios to shorten product import cycles.
Testing outsourcing services
Provide wafer level MRAM characterization services for early-stage entrepreneurial teams and research institutes, reducing the threshold for R&D investment.
Technology authorization and cooperation
Open core IP authorization, supporting device manufacturers and IDMs to jointly build a local MRAM testing ecosystem.