Customer Background

A storage design enterprise specializing in automotive electronics. Its products are required to comply with AEC-Q100 Grade 1 standard, with strict requirements on test coverage and data traceability.

Challenges

• Implement 100% cell testing and bad block management for the entire wafer

• Long test cycle for High Temperature Operating Life (HTOL), requiring accelerated evaluation methods

• Complete test data chain required for supply chain audit

Jimiao Solution

Deployed mass-production grade test solution, integrating high temperature dynamic burn-in test, automatic data archiving and SPC process control.

Achievements

• Test coverage increased to 99.97%

• HTOL pre-screening cycle shortened from 12 weeks to 3 weeks

• Passed the audit of Tier 1 automotive manufacturers and obtained mass production orders